Robust Low Power VLSI

VLSI Design Group

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2012

S. N. Wooters, Cabe, A. C., Qi, Z., Wang, J., Mann, R. W., Calhoun, B. H., Stan, M. R., and Blalock, T. N., “Tracking On-Chip Age Using Distributed, Embedded Sensors”, Transactions on VLSI Systems (TVLSI), vol. 20, p. 12, 2012.

2011

R. W. Mann, Hook, T. B., Nguyen, P., and Calhoun, B. H., “Non-Random Device Mismatch Considerations in Nanoscale SRAM”, IEEE Transactions of VLSI Systems (TVLSI), 2011.

S. N. Wooters, Cabe, A. C., Qi, Z., Wang, J., Mann, R. W., Calhoun, B. H., Stan, M. R., and Blalock, T. N., “Tracking On-Chip Age Using Distributed, Embedded Sensors”, Transactions on VLSI Systems (TVLSI), 2011.

2010

R. W. Mann, Wang, J., Nalam, S., Khanna, S., Braceras, G., Pilo, H., and Calhoun, B. H., “Impact of circuit assist methods on margin and performance in 6T SRAM”, Journal of Solid State Electronics, vol. 54, pp. 1398-1407, 2010.

J. Wang, Nalam, S., Qi, J., Mann, R. W., Stan, M., and Calhoun, B. H., “Improving SRAM Vmin and Yield by Using Variation-Aware BTI Stress”, in CICC, San Jose, CA, 2010.