TY - JOUR T1 - Tracking On-Chip Age Using Distributed, Embedded Sensors JF - Transactions on VLSI Systems (TVLSI) Y1 - 2012 A1 - S. N. Wooters A1 - A. C. Cabe A1 - Z. Qi A1 - J. Wang A1 - R. W. Mann A1 - B. H. Calhoun A1 - M. R. Stan A1 - T. N. Blalock VL - 20 ER - TY - JOUR T1 - Non-Random Device Mismatch Considerations in Nanoscale SRAM JF - IEEE Transactions of VLSI Systems (TVLSI) Y1 - 2011 A1 - R. W. Mann A1 - T. B. Hook A1 - P. Nguyen A1 - B. H. Calhoun ER - TY - JOUR T1 - Tracking On-Chip Age Using Distributed, Embedded Sensors JF - Transactions on VLSI Systems (TVLSI) Y1 - 2011 A1 - Stuart N. Wooters A1 - A. C. Cabe A1 - Z. Qi A1 - J. Wang A1 - R. W. Mann A1 - B. H. Calhoun A1 - M. R. Stan A1 - Travis N. Blalock ER - TY - JOUR T1 - Impact of circuit assist methods on margin and performance in 6T SRAM JF - Journal of Solid State Electronics Y1 - 2010 A1 - R. W. Mann A1 - J. Wang A1 - S. Nalam A1 - S. Khanna A1 - G. Braceras A1 - H. Pilo A1 - B. H. Calhoun KW - Process variation KW - Read assist KW - Scaling KW - SNM KW - SRAM KW - Vmin KW - Write assist KW - Write margin KW - Yield PB - Elsevier VL - 54 UR - http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TY5-50GTRCY-1&_user=709071&_coverDate=11%2F30%2F2010&_rdoc=1&_fmt=high&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000039638&_version=1&_urlVersion=0&_userid=709071&md5=2d0ef46bf2e72b91309a5c16 N1 - published U1 - Mann_SSE2010.pdf|Mann_SSE2010.pdf ER - TY - CONF T1 - Improving SRAM Vmin and Yield by Using Variation-Aware BTI Stress T2 - CICC Y1 - 2010 A1 - Jiajing Wang A1 - Nalam, Satyanand A1 - Jerry Qi A1 - R. W. Mann A1 - Mircea Stan A1 - B. H. Calhoun JF - CICC CY - San Jose, CA U1 - wang_cicc2010_paper.pdf|wang_cicc2010_paper.pdf ER -