Robust Low Power VLSI

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S. N. Wooters, Cabe, A. C., Qi, Z., Wang, J., Mann, R. W., Calhoun, B. H., Stan, M. R., and Blalock, T. N., “Tracking On-Chip Age Using Distributed, Embedded Sensors”, Transactions on VLSI Systems (TVLSI), vol. 20, p. 12, 2012.

S. N. Wooters, Cabe, A. C., Qi, Z., Wang, J., Mann, R. W., Calhoun, B. H., Stan, M. R., and Blalock, T. N., “Tracking On-Chip Age Using Distributed, Embedded Sensors”, Transactions on VLSI Systems (TVLSI), 2011.

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B. H. Calhoun, Khanna, S., Mann, R., and Wang, J., “Sub-threshold Circuit Design with Shrinking CMOS Devices”, in International Symposium on Circuits and Systems, 2009.

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J. Wang and Calhoun, B. H., “Minimum Supply Voltage and Yield Estimation for Large SRAMs Under Parametric Variations”, Transactions on VLSI Systems (TVLSI), 2011.

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R. W. Mann, Wang, J., Nalam, S., Khanna, S., Braceras, G., Pilo, H., and Calhoun, B. H., “Impact of circuit assist methods on margin and performance in 6T SRAM”, Journal of Solid State Electronics, vol. 54, pp. 1398-1407, 2010.

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J. Boley, Wang, J., and Calhoun, B. H., “Analyzing Sub-Threshold Bitcell Topologies and the Effects of Assist Methods on SRAM VMIN”, Journal of Low Power Electronics and Applications (JLPEA), vol. 2, p. 12, 2012.

J. Boley, Calhoun, B. H., and Wang, J., “Analyzing Subthreshold Bitcell Topologies and the Effects of Assist Methods on SRAM Vmin”. 2011.

J. Wang, Nalam, S., and Calhoun, B. H., “Analyzing Static and Dynamic Write Margin for Nanometer SRAMs”, in International Symposium on Low Power Electronics and Design, 2008, pp. 129-134.