Home /
A post-silicon hold time closure technique using data-path tunable-buffers for variation-tolerance in sub-threshold designs
A post-silicon hold time closure technique using data-path tunable-buffers for variation-tolerance in sub-threshold designs
D. Akella Kamakshi, Guo, X., Patel, H. N., Stan, M. R., and Calhoun, B. H.,
“A post-silicon hold time closure technique using data-path tunable-buffers for variation-tolerance in sub-threshold designs”, in
19th International Symposium on Quality Electronic Design (ISQED), 2018.
