Robust Low Power VLSI
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J. Wang and Calhoun, B. H., “Minimum Supply Voltage and Yield Estimation for Large SRAMs Under Parametric Variations”, Transactions on VLSI Systems (TVLSI), 2011.
J. Wang, Nalam, S., and Calhoun, B. H., “Analyzing Static and Dynamic Write Margin for Nanometer SRAMs”, in International Symposium on Low Power Electronics and Design, 2008, pp. 129-134.