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H. N. Patel, Yahya, F. B., and Calhoun, B. H., “Subthreshold SRAM: Challenges, Design Decisions, and Solutions”, in 60th IEEE International Midwest Symposium on Circuits and Systems, Boston, MA, USA, 2017.
H. N. Patel, Mann, R. W., and Calhoun, B. H., “Soft Errors: Reliability Challenges in Energy-Constrained ULP Body Sensor Networks Applications”, in 23rd IEEE International Symposium on On-Line Testing and Robust System Design, Thessaloniki, Greece, 2017.