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High Reliability SRAM for Extreme Environmental Conditions

This project investigates circuit and architectural techniques to improve the reliability of SRAM at extreme temperatures, particularly for automotive applications. The goal is to design and implement SRAMs that are capable of monitoring and adapting their circuits and micro-architectures to very wide range changes in environmental conditions.

Faculty: Ben Calhoun, Ken Mai (CMU) Students: Randy Mann, Satya Nalam, Sudhanshu Khanna Industry: Alexander Hoefler (Freescale) Sponsor: SRC

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