Robust Low Power VLSI

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Conference Paper

J. Wang, Nalam, S., Qi, J., Mann, R. W., Stan, M., and Calhoun, B. H., “Improving SRAM Vmin and Yield by Using Variation-Aware BTI Stress”, in CICC, San Jose, CA, 2010.

J. Qi, Wang, J., Calhoun, B. H., and Stan, M., “MSN: Memory Sensor for NBTI”, in Techcon, 2009.

J. Qi, Wang, J., Calhoun, B. H., and Stan, M., “SRAM-Based NBTI/PBTI Sensor System Design”, in Design Automation Conference (DAC), San Diego, CA, 2010, pp. 849-852.