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Book Chapter
B. H. Calhoun, ,, and Chandrakasan, A., Power Gating and Dynamic Voltage Scaling, in Leakage in Nanometer Technologies, S. Narendra and Chandrakasan, A., Eds. Springer, 2006, pp. 41-75.
Conference Paper
J. Wang, Nalam, S., and Calhoun, B. H., Analyzing Static and Dynamic Write Margin for Nanometer SRAMs, in International Symposium on Low Power Electronics and Design, 2008, pp. 129-134.
S. Nalam, Chandra, V., Pietrzyk, C., Aitken, R. C., and Calhoun, B. H., Asymmetric 6T SRAM with Two-phase Write and Split Bitline Differential Sensing for Low Voltage Operation, in ISQED, 2010, pp. 139-146.
S. Nalam and Calhoun, B. H., Asymmetric Sizing in a 45nm 5T SRAM to Improve Read Stability over 6T, in CICC, 2009, pp. 709-712.
F. Zhang, Zhang, Y., Silver, J., Shakhsheer, Y., Nagaraju, M., Klinefelter, A., Pandey, J., Boley, J., Carlson, E., Shrivastava, A., Otis, B., and Calhoun, B., A Batteryless 19uW MICS/ISM-Band Energy Harvesting Body Area Sensor Node SoC, in ISSCC, San Francisco, 2012.
S. Nalam, Chandra, V., Aitken, R. C., and Calhoun, B. H., Dynamic Write Limited Minimum Operating Voltage for Nanoscale SRAM, in Design Automation and Test Europe (DATE), 2011.
J. Wang, Nalam, S., Qi, J., Mann, R. W., Stan, M., and Calhoun, B. H., Improving SRAM Vmin and Yield by Using Variation-Aware BTI Stress, in CICC, San Jose, CA, 2010.
S. Khanna, Nalam, S. V., and Calhoun, B. H., Pipelined Non-Strobed Sensing Scheme for Lowering BL Swing in Nano-scale Memories, in VLSI Design Conference, 2014.
M. Bhargava, Nalam, S., Calhoun, B. H., and Mai, K., An SRAM Prototyping Tool for Rapid Sub-32nm Design Exploration and Optimization, in TECHCON, 2009.
S. Nalam, Bhargava, M., Ringgenberg, K., Mai, K., and Calhoun, B. H., A Technology-Agnostic Simulation Environment (TASE) for Iterative Custom IC Design across Processes, in ICCD, 2009, pp. 523-528.
S. Nalam, Bhargava, M., Mai, K., and Calhoun, B. H., Virtual Prototyper (ViPro): An Early Design Space Exploration and Optimization Tool for SRAM Designers, in Design Automation Conference (DAC), 2010, pp. 138-143.