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B. H. Calhoun, Cao, X. Li Yu, Mai, K., Pileggi, L. T., Rutenbar, R. A., and Shepard, K. L., Digital Circuit Design Challenges and Opportunities in the Era of Nanoscale CMOS, Proceedings of the IEEE (Special Issue on Integrated Electronics: Beyond Moore’s Law), vol. 96, pp. 343-365, 2008.
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H. Patel, Yahya, F., and Calhoun, B., Optimizing SRAM Bitcell Reliability and Energy for IoT Applications, in International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA, 2016.

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