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D. S. Truesdell, Li, S., and Calhoun, B. H., A 0.5V 560kHz 18.8fJ/Cycle Ultra-Low Energy Oscillator in 65nm CMOS with 96.1ppm/°C Stability Using a Duty-Cycled Digital Frequency-Locked Loop, in 2020 IEEE Symposium on VLSI Circuits (VLSI), 2020.PDF icon A 0.5V 560kHz 18.8fJ_Cycle Ultra-Low Energy Oscillator in 65nm CMOS with 96.1ppm_C Stability Using a Duty-Cycled Frequency-Locked Loop.pdf (2.67 MB)
D. S. Truesdell and Calhoun, B. H., Channel Length Sizing for Power Minimization in Leakage-Dominated Digital Circuits, in IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018.
D. S. Truesdell, Liu, X., Breiholz, J., Gupta, S., Li, S., and Calhoun, B. H., NanoWattch: A Self-Powered 3-nW RISC-V SoC Operable from 160mV Photovoltaic Input with Integrated Temperature Sensing and Adaptive Performance Scaling, in 2022 IEEE Symposium on VLSI Circuits (VLSI), (Equally-Credited Authors), 2022.PDF icon NanoWattch A Self-Powered 3-nW RISC-V SoC Operable from 160mV Photovoltaic Input with Integrated Temperature Sensing and Adaptive Performance Scaling.pdf (11.11 MB)
D. S. Truesdell, Dissanayake, A., and Calhoun, B. H., A 0.6-V 44.6-fJ/Cycle Energy-Optimized Frequency-Locked Loop in 65-nm CMOS With 20.3-ppm/°C Stability, IEEE Solid-State Circuits Letters (SSCL), 2019.PDF icon A 0.6-V 44.6-fJ Cycle Energy-Optimized Frequency-Locked Loop in 65-nm CMOS With 20.3-ppm C Stability.pdf (1.64 MB)
D. S. Truesdell, Li, S., and Calhoun, B. H., A 0.5V 560-kHz 18.8-fJ/Cycle On-Chip Oscillator with 96.1-ppm/°C Steady-State Stability Using a Duty-Cycled Digital Frequency-Locked Loop, IEEE Journal of Solid-State Circuits, 2021.PDF icon A 0.5-V 560-kHz 18.8-fJ_Cycle On-Chip Oscillator With 96.1ppm_C Steady-State Stability Using a Duty-Cycled Digital Frequency-Locked Loop.pdf (2.95 MB)
D. S. Truesdell, Breiholz, J., Kamineni, S., Liu, N. X., Magyar, A., and Calhoun, B. H., A 6–140-nW 11 Hz–8.2-kHz DVFS RISC-V Microprocessor Using Scalable Dynamic Leakage-Suppression Logic, IEEE Solid-State Circuits Letters (SSCL), 2019.PDF icon A 6–140-nW 11 Hz–8.2-kHz DVFS RISC-V Microprocessor Using Scalable Dynamic Leakage-Suppression Logic (1.63 MB)
D. S. Truesdell and Calhoun, B. H., A Single-Supply 6-Transistor Voltage Level Converter Design Reaching 8.18-fJ/Transition at 0.3-1.2-V Range or 44-fW Leakage at 0.8-2.5-V Range, IEEE Solid-State Circuits Letters (SSCL), 2020.PDF icon A Single-Supply 6-Transistor Voltage Level Converter Design Reaching 8.18-fJ_Transition at 0.3-1.2-V Range or 44-fW Leakage at 0.8-2.5-V Range.pdf (1.06 MB)
D. S. Truesdell and Calhoun, B. H., Improving Dynamic Leakage Suppression Logic with Forward Body Bias in 65nm CMOS, in IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2019.
D. S. Truesdell, Ahmed, S. Z., Ghosh, A. W., and Calhoun, B. H., Minimum-Energy Digital Computing with Steep Subthreshold Swing Tunnel FETs, IEEE Journal of Exploratory Solid-State Computational Devices and Circuits (JxCDC), 2020.PDF icon Minimum-Energy Digital Computing With Steep Subthreshold Swing Tunnel FETs.pdf (1.02 MB)
D. S. Truesdell and Calhoun, B. H., A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25°C Resolution, in IEEE Custom Integrated Circuits Conference (CICC) 2019, Austin, TX, 2019.PDF icon A 640 pW 22 pJ_sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25C Resolution.pdf (1.81 MB)