Robust Low Power VLSI

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R. W. Mann, Hook, T. B., Nguyen, P., and Calhoun, B. H., “Non-Random Device Mismatch Considerations in Nanoscale SRAM”, IEEE Transactions of VLSI Systems (TVLSI), 2011.

R. W. Mann, Wang, J., Nalam, S., Khanna, S., Braceras, G., Pilo, H., and Calhoun, B. H., “Impact of circuit assist methods on margin and performance in 6T SRAM”, Journal of Solid State Electronics, vol. 54, pp. 1398-1407, 2010.