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S. N. Wooters, Cabe, A. C., Qi, Z., Wang, J., Mann, R. W., Calhoun, B. H., Stan, M. R., and Blalock, T. N., “Tracking On-Chip Age Using Distributed, Embedded Sensors”, Transactions on VLSI Systems (TVLSI), vol. 20, p. 12, 2012.