Robust Low Power VLSI

VLSI Design Group

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Conference Paper

S. Nalam, Bhargava, M., Ringgenberg, K., Mai, K., and Calhoun, B. H., “A Technology-Agnostic Simulation Environment (TASE) for Iterative Custom IC Design across Processes”, in ICCD, 2009, pp. 523-528.

P. Long, Huang, J. Z., Povolotskyi, M., Verreck, D., Charles, J., Kubis, T., Klimeck, G., Rodwell, M. J. W., and Calhoun, B. H., “A Tunnel FET Design for High-Current, 120 mV Operation”, in IEDM, 2016.

Journal Article

S. N. Wooters, Cabe, A. C., Qi, Z., Wang, J., Mann, R. W., Calhoun, B. H., Stan, M. R., and Blalock, T. N., “Tracking On-Chip Age Using Distributed, Embedded Sensors”, Transactions on VLSI Systems (TVLSI), vol. 20, p. 12, 2012.

S. N. Wooters, Cabe, A. C., Qi, Z., Wang, J., Mann, R. W., Calhoun, B. H., Stan, M. R., and Blalock, T. N., “Tracking On-Chip Age Using Distributed, Embedded Sensors”, Transactions on VLSI Systems (TVLSI), 2011.