Robust Low Power VLSI
VLSI Design Group

Navigation

Search This Site

Publications

Export 1 results:
Author Title [ Type(Desc)] Year
Filters: First Letter Of Title is N and Author is R. W. Mann  [Clear All Filters]
Journal Article
R. W. Mann, Hook, T. B., Nguyen, P., and Calhoun, B. H., “Non-Random Device Mismatch Considerations in Nanoscale SRAM”, IEEE Transactions of VLSI Systems (TVLSI), 2011.