Robust Low Power VLSI

VLSI Design Group

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Conference Paper

P. Beshay, Chandra, V., Aitken, R., and Calhoun, B. H., “A Digital Dynamic Write Margin Sensor for Low Power Read/Write Operations in 28nm SRAM”, in ISLPED, 2014.

J. Boley, Chandra, V., Aitken, R., and Calhoun, B., “Leveraging Sensitivity Analysis for Fast, Accurate Estimation of SRAM Dynamic VMIN”, in Design Automation and Test Europe, 2013.