%0 Conference Paper %B 6th Asia Symposium on Quality Electronic Design (ASQED 2015) %D 2015 %T Combining SRAM Read/Write Assist Techniques for Near/Sub-Threshold Voltage Operation %A Farah B. Yahya %A Harsh N. Patel %A Vikas Chandra %A Benton H. Calhoun %B 6th Asia Symposium on Quality Electronic Design (ASQED 2015) %C Kuala Lumpur, Malaysia %8 08/2015 %G eng %1 asQED2015_Yahya_Rev5.pdf|asQED2015_Yahya_Rev5.pdf %0 Conference Paper %B ISLPED %D 2014 %T A Digital Dynamic Write Margin Sensor for Low Power Read/Write Operations in 28nm SRAM %A Peter Beshay %A Vikas Chandra %A Robert Aitken %A Benton H. Calhoun %B ISLPED %8 08/2014 %G eng %0 Conference Paper %B Design Automation and Test Europe %D 2013 %T Leveraging Sensitivity Analysis for Fast, Accurate Estimation of SRAM Dynamic VMIN %A James Boley %A Vikas Chandra %A Robert Aitken %A Benton Calhoun %B Design Automation and Test Europe %8 03/2013 %G eng %1 12.5_2_0693.pdf|12.5_2_0693.pdf %0 Conference Paper %B Subthreshold Microelectronics Conference %D 2012 %T SRAM Sense Amplifier Offset Cancellation Using BTI Stress %A Peter Beshay %A Jonathan Bolus %A Travis Blalock %A Vikas Chandra %A Benton H. Calhoun %B Subthreshold Microelectronics Conference %8 10/2012 %G eng %1 Beshay_BTI_subVT12_poster.pdf|Beshay_BTI_subVT12_poster.pdf