%0 Conference Paper %B 2017 IEEE International Test Conference (ITC) %D 2017 %T Modeling Trans-threshold Correlations for Reducing Functional Test Time in Ultra-Low Power Systems %A Christopher J Lukas %A Farah B. Yahya %A Benton H. Calhoun %B 2017 IEEE International Test Conference (ITC) %I IEEE %C Fort Worth, TX, USA %8 2017 %G eng