TY - CHAP T1 - Power Gating and Dynamic Voltage Scaling T2 - Leakage in Nanometer Technologies Y1 - 2006 A1 - Benton H. Calhoun A1 - James Kao, A1 - Anantha Chandrakasan ED - Siva Narendra ED - Anantha Chandrakasan JF - Leakage in Nanometer Technologies PB - Springer ER -