TY - CONF T1 - Optimizing SRAM Bitcell Reliability and Energy for IoT Applications T2 - International Symposium on Quality Electronic Design (ISQED) Y1 - 2016 A1 - Harsh Patel A1 - Farah Yahya A1 - Benton Calhoun JF - International Symposium on Quality Electronic Design (ISQED) PB - IEEE CY - Santa Clara, CA U1 - Optimizing SRAM Bitcell Reliability and Energy for IoT Applications.pdf|Optimizing SRAM Bitcell Reliability and Energy for IoT Applications.pdf ER -