TY - JOUR T1 - A comprehensive analysis of Auger generation impacted planar Tunnel FETs JF - Solid-State Electronics Y1 - 2020 A1 - Sheikh Z. Ahmed A1 - Daniel S. Truesdell A1 - Yaohua Tan A1 - Benton H. Calhoun A1 - Avik W. Ghosh ER -