TY - JOUR T1 - Static Noise Margin Variation for Sub-threshold SRAM in 65nm CMOS JF - IEEE Journal of Solid-State Circuits (JSSC) Y1 - 2006 A1 - Benton H. Calhoun A1 - Anantha Chandrakasan VL - 41 U1 - Calhoun_JSSC06_snm.pdf|Calhoun_JSSC06_snm.pdf ER -