TY - CONF T1 - Modeling Trans-threshold Correlations for Reducing Functional Test Time in Ultra-Low Power Systems T2 - 2017 IEEE International Test Conference (ITC) Y1 - 2017 A1 - Christopher J Lukas A1 - Farah B. Yahya A1 - Benton H. Calhoun JF - 2017 IEEE International Test Conference (ITC) PB - IEEE CY - Fort Worth, TX, USA ER -