@conference {4686,
	title = {A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25{\textdegree}C Resolution},
	booktitle = {IEEE Custom Integrated Circuits Conference (CICC) 2019},
	year = {2019},
	month = {04/2019},
	publisher = {IEEE},
	organization = {IEEE},
	address = {Austin, TX},
	author = {Daniel S. Truesdell and Benton H. Calhoun}
}
