@conference {432, title = {Modeling Trans-threshold Correlations for Reducing Functional Test Time in Ultra-Low Power Systems}, booktitle = {2017 IEEE International Test Conference (ITC)}, year = {2017}, month = {2017}, publisher = {IEEE}, organization = {IEEE}, address = {Fort Worth, TX, USA}, author = {Christopher J Lukas and Farah B. Yahya and Benton H. Calhoun} }