H. Patel, Yahya, F., and Calhoun, B., “Optimizing SRAM Bitcell Reliability and Energy for IoT Applications”, in International Symposium on Quality Electronic Design (ISQED), Santa Clara, CA, 2016.Optimizing SRAM Bitcell Reliability and Energy for IoT Applications.pdf Google ScholarBibTexRTFTaggedMARCXMLRIS