A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25°C Resolution

D. S. Truesdell and Calhoun, B. H., “A 640 pW 22 pJ/sample Gate Leakage-Based Digital CMOS Temperature Sensor with 0.25°C Resolution”, in IEEE Custom Integrated Circuits Conference (CICC) 2019, Austin, TX, 2019.