Modeling Trans-threshold Correlations for Reducing Functional Test Time in Ultra-Low Power Systems

TitleModeling Trans-threshold Correlations for Reducing Functional Test Time in Ultra-Low Power Systems
Publication TypeConference Paper
Year of Publication2017
AuthorsLukas, C. J., F. B. Yahya, and B. H. Calhoun
Conference Name2017 IEEE International Test Conference (ITC)
Date Published2017
PublisherIEEE
Conference LocationFort Worth, TX, USA
Citation Key432