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A 256kb 65nm Sub-threshold SRAM Design for Ultra-low Voltage Operation

Pub Year: 
2007
Primary Author: 
Coference, Book, or Journal: 
IEEE Journal of Solid-State Circuits (JSSC),volume = 42
Pages: 
680-688
Date Published: 
March, 2018
Attachments: 
Calhoun_JSSC07.pdf
BibTeX Number: 
61
Pub Type: 
article