Optimizing SRAM Bitcell Reliability and Energy for IoT Applications

TitleOptimizing SRAM Bitcell Reliability and Energy for IoT Applications
Publication TypeConference Paper
Year of Publication2016
AuthorsPatel, H., F. Yahya, and B. Calhoun
Conference NameInternational Symposium on Quality Electronic Design (ISQED)
Date Published2016
PublisherIEEE
Conference LocationSanta Clara, CA
Citation Key372
AttachmentSize
Optimizing SRAM Bitcell Reliability and Energy for IoT Applications.pdf368.53 KB
ISQED2016__Session1A_Submission29_HarshPatel.pdf3.27 MB