Non-Random Device Mismatch Considerations in Nanoscale SRAM

TitleNon-Random Device Mismatch Considerations in Nanoscale SRAM
Publication TypeJournal Article
Year of Publication2011
AuthorsMann, R. W., T. B. Hook, P. Nguyen, and B. H. Calhoun
JournalIEEE Transactions of VLSI Systems (TVLSI)
Citation Key283