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Modeling Trans-threshold Correlations for Reducing Functional Test Time in Ultra-Low Power Systems

Pub Year: 
2017
Primary Author: 
Coference, Book, or Journal: 
2017 IEEE International Test Conference (ITC)
Date Published: 
July, 2005
Publisher: 
IEEE
Organization: 
IEEE
Address: 
Fort Worth, TX, USA
BibTeX Number: 
432
Pub Type: 
conference