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Filters: Author is R. W. Mann [Clear All Filters]
"Tracking On-Chip Age Using Distributed, Embedded Sensors", Transactions on VLSI Systems (TVLSI), vol. 20, issue 11, pp. 12, 11/2012.
"Non-Random Device Mismatch Considerations in Nanoscale SRAM", IEEE Transactions of VLSI Systems (TVLSI), 2011.
"Tracking On-Chip Age Using Distributed, Embedded Sensors", Transactions on VLSI Systems (TVLSI), 2011.
"Impact of circuit assist methods on margin and performance in 6T SRAM", Journal of Solid State Electronics, vol. 54: Elsevier, pp. 1398-1407, 11/2010.
"Improving SRAM Vmin and Yield by Using Variation-Aware BTI Stress", CICC, San Jose, CA, 09/2010.