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Patel, H. N., F. B. Yahya, and B. H. Calhoun, "Subthreshold SRAM: Challenges, Design Decisions, and Solutions", 60th IEEE International Midwest Symposium on Circuits and Systems, Boston, MA, USA , IEEE, 08/2017.  Download: MWCAS_2017_Final_IEEE_Submitted.pdf (1.98 MB); MWCAS2017__SessionA3L-B_PaperID1465_HarshPatel.pdf (3.51 MB)
Patel, H. N., R. W. Mann, and B. H. Calhoun, "Soft Errors: Reliability Challenges in Energy-Constrained ULP Body Sensor Networks Applications", 23rd IEEE International Symposium on On-Line Testing and Robust System Design, Thessaloniki, Greece, IEEE, 06/2017.  Download: IOLTS_2017_Poster_Paper_Submitted.pdf (765.27 KB)
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